Jim Handy
Jim Handy of Objective Analysis has over 35 years in the electronics industry including 20 years as a leading semiconductor and SSD industry analyst. Early in his career he held marketing and design positions at leading semiconductor suppliers including Intel, National Semiconductor, and Infineon. A frequent presenter at trade shows, Mr. Handy is highly respected for his technical depth, accurate forecasts, widespread industry presence and volume of publication. He has written hundreds of market reports, articles for trade journals, and white papers, and is frequently interviewed and quoted in the electronics trade press and other media.
Siddarth Krishnan
Siddarth Krishnan is Managing Director, at Applied Materials, with an R&D focus on Materials Engineering for Heterogenous Integration, Power Devices and alternative memories (RERAM, FERAM etc). In his role, Siddarth and his team research ways of building modules that help connect memory chips (such as High Bandwidth memories) with logic chips and chips with other functionality, using 2D, 2.5D and 3D Integration. Prior to working on Heterogenous Integration, Siddarth worked on various other materials engineering areas, such as MicroLED and Analog In Memory Compute. Previously, Siddarth was an engineering manager at IBM, working on High-K/Metal Gate and FinFET devices.
John Overton
John Overton is the CEO of Kove IO, Inc. In the late 1980s, while at the Open Software Foundation, Dr. Overton wrote software that went on to be used by approximately two thirds of the world’s workstation market. In the 1990s, he co-invented and patented technology utilizing distributed hash tables for locality management, now widely used in storage, database, and numerous other markets. In the 2000s, he led development of the first truly capable Software-Defined Memory offering, Kove:SDM™. Kove:SDM™ enables new Artificial Intelligence and Machine Learning capabilities, while also reducing power by up to 50%. Dr. Overton has more than 65 issued patents world-wide and has peer-reviewed publications across numerous academic disciplines. He holds post-graduate and doctoral degrees from Harvard and the University of Chicago.
Brett Dodds
